Carl Zeiss Tag

  • Carl Zeiss SMT introduced a new family member of AURIGA CrossBeam (FIB-SEM) workstations featuring a large 6 inch stage vacuum chamber and a total of 23 free accessory ports. The new AURIGA 60 platform essentially broadens the application spectrum of the well established ZEISS CrossBeam technology. Its vacuum chamber is […]

    AURIGA 60 CrossBeam Workstation from Carl Zeiss

    September 20, 2010 by Al Hilal
    Carl Zeiss SMT introduced a new family member of AURIGA CrossBeam (FIB-SEM) workstations featuring a large 6 inch stage vacuum chamber and a total of 23 free accessory ports. The new AURIGA 60 platform essentially broadens the application spectrum of the well established ZEISS CrossBeam technology. Its vacuum chamber is […]
  • In order to fill the need of of ultra-high resolution imaging and analytical capabilities, Carl Zeiss unveils next-gen analytical electron microscope – MERLIN FE-SEM. Enhanced by GEMINI II column on its core, the system can achieve an image resolution of 0.8 nanometers. Follow the “Read” link below to get full […]

    Carl Zeiss’s MERLIN FE-SEM: Next-gen Analytical Electron Microscope

    July 2, 2009 by Al Hilal
    In order to fill the need of of ultra-high resolution imaging and analytical capabilities, Carl Zeiss unveils next-gen analytical electron microscope – MERLIN FE-SEM. Enhanced by GEMINI II column on its core, the system can achieve an image resolution of 0.8 nanometers. Follow the “Read” link below to get full […]