Carl Zeiss’s MERLIN FE-SEM: Next-gen Analytical Electron Microscope 750 views
Posted 02 July 2009 by N. A. Hilal
Filed under: Miscellaneous
Filed under: Miscellaneous
In order to fill the need of of ultra-high resolution imaging and analytical capabilities, Carl Zeiss unveils next-gen analytical electron microscope – MERLIN FE-SEM. Enhanced by GEMINI II column on its core, the system can achieve an image resolution of 0.8 nanometers. Follow the “Read” link below to get full details.
“The new MERLIN, as well as the just recently introduced AURIGA CrossBeam workstation perfectly embody what our products stand for: Maximum Information – Maximum Insight”, Stenkamp points out. “And – the market can expect much more in the coming weeks until M&M show and the European Microscopy Conference in Graz, Austria, end of August.”
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